Cite this article:
Kumar and Mishra (1997). Reliability of Semi Conductor Devices Under Contaminated Atmospheric Conditions. Journal of Ravishankar University (Part-B: Science), 10(1), pp. 83-88.
Journal of Ravishankar University, Vol 10, No.B (Science) 1997 pp.83-88 ISSN 0970-5910
Reliability of Semi Conductor Devices
Under
Contaminated Atmospheric Conditions
Anil Kumar*
and A.P. Mishra**
• Govt. Model Science college
Rewa (M.P.)
**Dept of Physics, APS University Rewa
(M.P.)
M.S.: Received : 08-09-97; Accepted : 09-03-98
Abstract. Present
paper
deals with the reliability of the Semi conductor devices
under contaminated
atmospheric conditions. In order to discus the better performance and durability, physics of the devices have
taken
into
consideration. Under various stress
conditions performance and reliability of the
devices are discussed.
NOTE: Full version
of this manuscript is available in PDF.